Discussion on quality inspection technology for new fundamental surveying and mapping
HAN Wenli, ZHANG Jixian, CHEN Haipeng, HUANG Haiying, ZHANG Libo, GE Juan, SHEN Jing, LU Yao
Bulletin of Surveying and Mapping . 2022, (7): 148 -153 .  DOI: 10.13474/j.cnki.11-2246.2022.0220