×
模态框(Modal)标题
在这里添加一些文本
Close
Close
Submit
Cancel
Confirm
×
模态框(Modal)标题
在这里添加一些文本
Close
Toggle navigation
Home
About Journal
Editorial Board
Instruction
Subscription
Advertisement
Contact Us
中文
Discussion on quality inspection technology for new fundamental surveying and mapping
HAN Wenli, ZHANG Jixian, CHEN Haipeng, HUANG Haiying, ZHANG Libo, GE Juan, SHEN Jing, LU Yao
Bulletin of Surveying and Mapping . 2022, (
7
): 148 -153 . DOI: 10.13474/j.cnki.11-2246.2022.0220