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Discussion on quality inspection technology for new fundamental surveying and mapping
HAN Wenli, ZHANG Jixian, CHEN Haipeng, HUANG Haiying, ZHANG Libo, GE Juan, SHEN Jing, LU Yao
Bulletin of Surveying and Mapping
2022, 0 (7):
148-153.
DOI: 10.13474/j.cnki.11-2246.2022.0220
In view of the technical requirements and challenges brought to quality inspection by the innovation of concept, technology, product and organization mode in new fundamental surveying and mapping, aiming at improving the automatic and intelligent quality inspection ability, this paper constructs the quality inspection technical framework of new fundamental surveying and mapping. And proposes the research content and direction of modern quality inspection infrastructure and equipment, new theory and common technology, real-time data processing and quality inspection technology,networked service mode.Promote the application of big data, knowledge map, blockchain, cloud service and other technologies in new fundamental surveying and mapping quality inspection. Improve the quality assurance ability and level of new fundamental surveying and mapping, and support the transformation and high-quality development of fundamental surveying and mapping.
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